Patents

2019

    • [Granted Patent] Apparatus and Method for Measuring Difficulty Level of Chinese Character Using Regression Analysis(회귀 분석을 이용한 한자 난이도 측정 장치 및 방법), Suntae Kim, Jeongwhan Choi, Jiwoo Noh, Domestic Patent(Application Number:10-2019-0141339 ). 2019.11. https://doi.org/10.8080/1020190141339